CLEVELAND--(BUSINESS WIRE)--The IEEE has named Dr. Dylan Forrest Williams as the recipient of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. The award, which Keithley Instruments, Inc. has sponsored since its establishment in 2000, is presented for outstanding contributions in the field of electrical measurement. This year’s award recognizes Williams for the development of traceable mismatch-corrected microwave-scattering parameters and the application of these corrections to temporal waveform calibration and measurement. The award consists of a bronze medal, a certificate, and an honorarium. It will be presented on June 3, 2013, at the IEEE Microwave Theory and Techniques Society International Microwave Symposium in Seattle, Washington.
Williams is an IEEE Fellow and an electrical engineer with the National Institute of Standards and Technology (NIST), located in Boulder, Colorado. The insights he has provided into microwave measurements defined the most accurate measurement approaches for the low-cost testing of chips for portable wireless devices. While working with NIST, Williams pioneered the development of methods for determining the characteristic impedance of printed transmission lines and accurate on-wafer scattering-parameter calibrations. On-wafer measurements allow direct testing of integrated circuits (ICs) in the lab before being packaged. His work has facilitated development of the monolithic-microwave and radio-frequency IC technology behind low-cost wireless components. Williams’ work also led to the development of mismatch-corrected temporal waveform standards at NIST. These calibrations have been used to establish traceability for high-speed oscilloscopes and large-signal network analyzers.
Criteria considered by the award's IEEE Evaluation Committee include innovation or development, social value, uniqueness of concept, other technical accomplishments, and the quality of the nomination. The award is administered through the Technical Field Awards Council of the IEEE Awards Board and is independent of Keithley Instruments. For additional information on IEEE Technical Field Awards and Medals, to view complete lists of past recipients, or to nominate a colleague or associate for IEEE Technical Field Awards and Medals, please visit http://www.ieee.org/awards.
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About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.
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